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Sliced Wasserstein Sketches with Error Certificates

arXiv机器学习 2026-10-15 02:32 3 阅读 查看原文

Compact representations that support geometrically meaningful comparisons are valuable for learning from probability distributions.

We study optimal, free-weight $M$-atom quantization of one-dimensional probability measures in quadratic Wasserstein distance and extend it to higher dimensions via slicing.

Using $L$ shared projections yields a sketch with $O(LM)$ comparison time.

Our main result is an exact decomposition of squared distance error into residual and partition-mismatch terms, yielding computable certificates for arbitrary centroid sketches.

For optimal sketches, a finite $(2+δ)$ moment for some $δ>0$ guarantees $O(M^{-1})$ error in the finite-direction sliced distance, while equal-mass sketches can converge more slowly.

Each slice preserves its mean, while storing residual energies enables covariance recovery from sufficiently many generic directions.

Experiments on document, point-cloud, and flow-cytometry benchmarks show that optimal sketches substantially reduce storage while preserving the classification performance of uncompressed sliced distances.

They also improve generalization from few labelled subjects and support end-to-end learning as compact pooling layers.